Polynomial identity testing for depth 3 circuits

Computational Complexity

Volumn 16, Issue 2, 2007, Pages 115-138

  Kayal, Neeraj ^a   Saxena, Nitin ^b  

^a INSTITUTE FOR ADVANCED STUDY   (United States)

^b CWI   (Netherlands)

Author keywords

Chinese remaindering; Depth of circuits; Identity testing; Rings

Indexed keywords

EID: 34249038395     PISSN: 10163328     EISSN: 14208954     Source Type: Journal    
DOI: 10.1007/s00037-007-0226-9     Document Type: Conference Paper

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