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Volumn 5125 LNCS, Issue PART 1, 2008, Pages 60-71

Diagonal circuit identity testing and lower bounds

Author keywords

Arithmetic circuit; Depth 3; Depth 4; Determinant; Identity testing; Lower bounds; Permanent

Indexed keywords

CONTROL THEORY; LINGUISTICS; TRANSLATION (LANGUAGES);

EID: 49049115339     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-540-70575-8_6     Document Type: Conference Paper
Times cited : (72)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.