Voigt effect measurement on PLD grown NiO thin films

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 7, Issue 2, 2010, Pages 334-337

  Scarlat, Camelia ^a   Mok, Kah Ming ^a   Zhou, Shengqiang ^a   Vinnichenko, Mykola ^a   Lorenz, Michael ^b   Grundmann, Marius ^b   Helm, Manfred ^a   Schubert, Mathias ^c   Schmidt, Heidemarie ^a  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b Inst Experimentelle Physik II   (Germany)

^c UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXTERNAL MAGNETIC FIELD; FLAT-TOP; HE-CD LASERS; IN-PLANE; MAGNETO-OPTICAL SENSORS; MAGNETOOPTIC EFFECTS; MATRIX FORMALISM; NIO THIN FILM; NON-VOLATILE; PARABOLIC DEPENDENCE; PLANE SAPPHIRE; POLARIZATION STATE; POLARIZED LIGHT; POTENTIAL APPLICATIONS; RESISTIVE RANDOM ACCESS MEMORY; SAPPHIRE SUBSTRATES; SECOND ORDERS; SOLAR THERMAL ABSORBERS; SPIN VALVE; VOIGT CONFIGURATION; VOIGT EFFECTS;

FERROMAGNETIC MATERIALS; FERROMAGNETISM; LIGHT TRANSMISSION; MAGNETIC FIELDS; MAGNETOOPTICAL DEVICES; NANOSCIENCE; OPTICAL FIBERS; PULSED LASER DEPOSITION; PULSED LASERS; RANDOM ACCESS STORAGE; SAPPHIRE; SOLAR ABSORBERS; SPINNING (FIBERS); SUBSTRATES; THIN FILMS;

SEMICONDUCTOR LASERS;

EID: 77954326464     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200982504     Document Type: Conference Paper

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