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Volumn 42, Issue 6-7, 2010, Pages 658-661
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XPS depth profiling of polystyrene etched by electrospray droplet impact
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Author keywords
Cluster ion etching; Electrospray droplet impact; Molecular depth profiling; Polystyrene
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Indexed keywords
CLUSTER IONS;
ELECTROSPRAY DROPLETS;
ETCHED SURFACE;
IRRADIATION TIME;
MOLECULAR DEPTH PROFILING;
MOLECULAR LEVELS;
SURFACE ETCHING;
SYNTHETIC POLYMERS;
WATER DROPLETS;
XPS DEPTH PROFILING;
XPS SPECTRA;
DROP FORMATION;
ETCHING;
POLYSTYRENES;
SURFACES;
X RAY PHOTOELECTRON SPECTROSCOPY;
DEPTH PROFILING;
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EID: 77954290394
PISSN: 01422421
EISSN: 10969918
Source Type: Journal
DOI: 10.1002/sia.3254 Document Type: Conference Paper |
Times cited : (25)
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References (11)
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