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Volumn 42, Issue 6-7, 2010, Pages 658-661

XPS depth profiling of polystyrene etched by electrospray droplet impact

Author keywords

Cluster ion etching; Electrospray droplet impact; Molecular depth profiling; Polystyrene

Indexed keywords

CLUSTER IONS; ELECTROSPRAY DROPLETS; ETCHED SURFACE; IRRADIATION TIME; MOLECULAR DEPTH PROFILING; MOLECULAR LEVELS; SURFACE ETCHING; SYNTHETIC POLYMERS; WATER DROPLETS; XPS DEPTH PROFILING; XPS SPECTRA;

EID: 77954290394     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3254     Document Type: Conference Paper
Times cited : (25)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.