Optical properties of silver thin films, derived from REELS

Surface and Interface Analysis

Volumn 42, Issue 6-7, 2010, Pages 1303-1306

  Zhang, Z M ^a   Chen, T ^a   Ding, Z J ^a   Tang, T ^a   Csik, A ^b   Toth J ^b   Tokesi K ^b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b INSTITUTE OF NUCLEAR RESEARCH ATOMKI   (Hungary)

Author keywords

Kramers kronig; Optical properties; REELS; Surface excitation; Thin film

Indexed keywords

ELECTRONIC STRUCTURE AND OPTICAL PROPERTIES; INELASTIC MEAN FREE PATH; KRAMERS-KRONIG; KRAMERS-KRONIG DISPERSION; MEDIUM-ENERGY ELECTRON; OPTICAL PROPERTIES OF THIN FILMS; REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPIES; SILVER THIN FILMS; SURFACE EXCITATION; SURFACE EXCITATIONS; THIN LAYERS;

ELECTRON ENERGY ANALYZERS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; ENERGY DISSIPATION; FILM THICKNESS; OPTICAL PROPERTIES; REELS; SILVER; THIN FILMS; VAPOR DEPOSITION;

OPTICAL FILMS;

EID: 77954268338     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3312     Document Type: Conference Paper

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