SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 604, Issue 15-16, 2010, Pages 1294-1299

Surface morphology of c-plane sapphire (α-alumina) produced by high temperature anneal

(7) Cuccureddu, F a Murphy, S a,d Shvets, I V a Porcu, M b Zandbergen, H W b Sidorov, N S c Bozhko, S I c

a TRINITY COLLEGE DUBLIN (Ireland)

b DELFT UNIVERSITY OF TECHNOLOGY (Netherlands)

c INSTITUTE OF SOLID STATE PHYSICS (Russian Federation)

d TECHNICAL UNIVERSITY OF DENMARK (Denmark)

Author keywords

Aluminum oxide; Atomic force microscopy; Sapphire; Step formation and bunching; Surface structure and morphology

Indexed keywords

ALUMINUM OXIDE; ALUMINUM OXIDES; C-PLANE SAPPHIRE; COMPARATIVE STUDIES; HIGH TEMPERATURE; LOW INDEX; STEP BUNCHING; STEP FORMATION AND BUNCHING; SURFACE EVOLUTION; TEM; VICINAL SUBSTRATES;

ALUMINUM; ATOMIC FORCE MICROSCOPY; ATOMS; COALESCENCE; IMAGE ANALYSIS; MORPHOLOGY; OXIDES; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SOIL CONSERVATION; TRANSMISSION ELECTRON MICROSCOPY;

SURFACE MORPHOLOGY;

EID: 77954243745 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2010.04.017 Document Type: Article

Times cited : (74)

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