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Volumn 224, Issue 6, 2010, Pages 853-868

Large-volume metrology instrument selection and measurability analysis

Author keywords

measurability; measurement planning; process classification; process modelling

Indexed keywords

LITTLE RESEARCH; MANUFACTURING PROCESS; MEASUREMENT PLANNING; MEASUREMENT PROCESS; METROLOGY INSTRUMENTS; PROTOTYPE INSTRUMENT; SELECTION CRITERIA;

EID: 77954233942     PISSN: 09544054     EISSN: None     Source Type: Journal    
DOI: 10.1243/09544054JEM1676     Document Type: Article
Times cited : (49)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.