Optical shape measurement technology: past, present and future

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4076, Issue , 2000, Pages 162-173

  Huntley, J M ^a  

^a LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; INTERFEROMETRY; MEASUREMENT ERRORS; MOIRE FRINGES; OPTICAL RADAR; SPATIAL VARIABLES MEASUREMENT;

GRAY CODE METHOD; LASER TRIANGULATION; OPTICAL SHAPE MEASUREMENT; PROFILOMETRY; PROJECTED FRINGES; WHITE LIGHT INTERFEROMETRY;

OPTICAL SENSORS;

EID: 0033695459     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (62)