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Volumn 71, Issue 6, 2010, Pages 874-879
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Switching effect and the metalinsulator transition in electric field
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Author keywords
Electrical properties; Oxides; Phase transitions; Thin films
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Indexed keywords
APPLIED ELECTRIC FIELD;
CARRIER DENSITY;
CRITICAL CONCENTRATION;
ELECTRIC FIELD STRENGTH;
ELECTRICAL PROPERTIES;
ELECTRICAL PROPERTY;
IV CHARACTERISTICS;
NON-EQUILIBRIUM CARRIERS;
PHENOMENOLOGICAL APPROACH;
QUANTITATIVE AGREEMENT;
S-SHAPED;
SWITCHING EFFECT;
SWITCHING MECHANISM;
TEMPERATURE RANGE;
THRESHOLD FIELDS;
VANADIUM DIOXIDE;
CARRIER CONCENTRATION;
ELECTRIC FIELD MEASUREMENT;
ELECTRIC FIELDS;
PHASE TRANSITIONS;
THIN FILMS;
VANADIUM;
VANADIUM ALLOYS;
ELECTRIC PROPERTIES;
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EID: 77954215044
PISSN: 00223697
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jpcs.2010.03.032 Document Type: Article |
Times cited : (58)
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References (43)
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