|
Volumn 172, Issue 1, 1999, Pages 131-136
|
Delay time measurements of NiS2-xSex-based switches
a b c c |
Author keywords
[No Author keywords available]
|
Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC FIELDS;
METAL INSULATOR BOUNDARIES;
SEMICONDUCTING SELENIUM COMPOUNDS;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR METAL BOUNDARIES;
THRESHOLD VOLTAGE;
DELAY TIME MEASUREMENT;
SEMICONDUCTOR SWITCHES;
|
EID: 0033100556
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1521-396X(199903)172:1<131::AID-PSSA131>3.0.CO;2-I Document Type: Article |
Times cited : (5)
|
References (8)
|