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Volumn 172, Issue 1, 1999, Pages 131-136

Delay time measurements of NiS2-xSex-based switches

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELDS; METAL INSULATOR BOUNDARIES; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR METAL BOUNDARIES; THRESHOLD VOLTAGE;

EID: 0033100556     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199903)172:1<131::AID-PSSA131>3.0.CO;2-I     Document Type: Article
Times cited : (5)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.