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Japanese Journal of Applied Physics

Volumn 49, Issue 3 PART 1, 2010, Pages

Highly tansparent and high haze bilayer Al-Doped ZnO thin film employing oxygen-controlled seed layer

(5) Kang, Dong Won a Kuk, Seung Hee a Ji, Kwang Sun b Ahn, Seh Won b Han, Min Koo a

a Seoul National University (South Korea)

b LG Electronics Inc (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AL-DOPED ZNO; AZO FILMS; BI-LAYER; CRYSTALLINITIES; DC MAGNETRON SPUTTERING; ELECTRICAL PROPERTY; GRAIN SIZE; NEAR-INFRARED TRANSMITTANCES; NIR REGIONS; SEED LAYER; VISIBLE REGION; VISIBLE TRANSMITTANCE; X-RAY DIFFRACTION MEASUREMENTS;

ALUMINUM; ELECTRIC PROPERTIES; GALVANOMAGNETIC EFFECTS; HALL MOBILITY; INFRARED DEVICES; LIGHT SCATTERING; OPTICAL FILMS; OXYGEN; REFRACTION; SURFACE TOPOGRAPHY; X RAY DIFFRACTION; ZINC OXIDE;

TOPOGRAPHY;

EID: 77954013028 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.49.031101 Document Type: Article

Times cited : (22)

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