Thickness changes in polythiophene gas sensors exposed to vapor

Sensors and Actuators, B: Chemical

Volumn 148, Issue 1, 2010, Pages 74-80

  Liao, F ^a   Toney, M F ^b   Subramanian, V ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

Gas sensor; Organic thin film; Polythiophene; X ray reflectivity

Indexed keywords

ANALYTE CONCENTRATION; ANALYTE MOLECULES; ANALYTES; GAS SENSORS; IN-SITU; ORGANIC SEMICONDUCTOR; ORGANIC THIN FILMS; PHYSICAL CHANGES; POLY-THIOPHENE; POLYMER BASED; POLYTHIOPHENE FILMS; X RAY REFLECTIVITY;

GAS DETECTORS; REFLECTION; THIN FILMS; VAPORS; X RAYS;

CHEMICAL SENSORS;

EID: 77953911264     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2010.04.035     Document Type: Article

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