Single-shot picosecond interferometry with one-nanometer resolution for dynamical surface morphology using a soft X-ray laser

Optics Express

Volumn 18, Issue 13, 2010, Pages 14114-14122

  Suemoto, Tohru ^a   Terakawa, Kota ^a   Ochi, Yoshihiro ^b   Tomita, Takuro ^c   Yamamoto, Minoru ^c   Hasegawa, Noboru ^b   Deki, Manato ^c   Minami, Yasuo ^a   Kawachi, Tetsuya ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

^c UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MIRRORS; MORPHOLOGY; PLATINUM; PUMPING (LASER); PUMPS; SILVER; X RAY LASERS;

ABLATION PROCESS; COHERENT RADIATION; DEPTH SENSITIVITY; LATERAL RESOLUTION; LLOYD'S MIRROR; NANO-METER SCALE; NANOMETER RESOLUTIONS; NEAR INFRARED; PICOSECOND INTERFEROMETRY; PT FILMS; PUMP PULSE; PUMP-AND-PROBE; SINGLE-SHOT; SOFT X-RAY LASER; SPATIAL RESOLUTION; SURFACE DILATION; TEST PATTERN; TIME-RESOLUTION;

SURFACE MORPHOLOGY;

NANOPARTICLE; PLATINUM; SILICON DIOXIDE;

ARTICLE; EQUIPMENT DESIGN; INSTRUMENTATION; INTERFEROMETRY; LASER; METHODOLOGY; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; THEORETICAL MODEL; ULTRAVIOLET RADIATION; X RAY;

EQUIPMENT DESIGN; INTERFEROMETRY; LASERS; MICROSCOPY, ELECTRON, SCANNING; MODELS, THEORETICAL; NANOPARTICLES; NANOTECHNOLOGY; PLATINUM; SILICON DIOXIDE; ULTRAVIOLET RAYS; X-RAYS;

EID: 77953842809     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.014114     Document Type: Article

References (26)

1. S. K. Sundaram, and E. Mazur, "Inducing and probing non-thermal transitions in semiconductors using femtosecond laser pulses," Nat. Mater. 1(4), 217-224 (2002).
2. J. Reif, F. Costache, and M. Bestehorn, in "Recent Advances in. Laser Processing of Materials," (ed. J. Perriere, E. Millon, and E. Fogarassy, Chap 9, pp. 275-290 (Elsevier, Oxford U.K., 2006).
3. K. Nasu, H. Ping, and H. Mizouchi, "Photoinduced structural phase transitions and their dynamics," J. Phys. Condens. Matter 13(35), 201 (2001).
4. A. Cavalleri, C. Tóth, C. W. Siders, J. A. Squier, F. Ráksi, P. Forget, and J. C. Kieffer, "Femtosecond Structural Dynamics in VO2 during an Ultrafast Solid-Solid Phase Transition," Phys. Rev. Lett. 87(23), 237401 (2001).
5. K. Sokolowski-Tinten, C. Blome, J. Blums, A. Cavalleri, C. Dietrich, A. Tarasevitch, I. Uschinann, E. Förster, M. Kammler, M.. Horn-von-Hoegen, and D. von der Linde, "Femtosecond X-ray measurement of coherent lattice vibrations near the Lindeinann stability limit," Nature 422(6929), 287-289 (2003).
6. P. Baum, D.-S. Yang, and A. H. Zewail, "4D visualization of transitional structures in phase transformations by electron diffraction," Science 318(5851), 788-792 (2007).
7. V. V. Temnov, K. Sokolowski-Tinten, P. Zhou, and D. von der Linde, "Femtosecond time-resolved interferometric microscopy," Appl. Phys., A Mater. Sci. Process. 78(4), 483-489 (2004).
8. W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, "Soft X-ray microscopy at a spatial resolution better than 15 nm," Nature 435(7046), 1210-1213 (2005).
9. W. Chao, J. Kim, S. Rekawa, P. Fischer, and E. H. Anderson, "Demonstration of 12 nm resolution Fresnel zone plate lens based soft x-ray microscopy," Opt. Express 17(20), 17669-17677 (2009).
10. A. Barty, S. Boutet, M. J. Bogan, S. Hau-Riege, S. Marchesini, K. Sokolowski-Tinten, N. Stojanovic, R. Tobey, H. Ehrke, A. Cavalleri, S. Düsterer, M. Frank, S. Bajt, B. W. Woods, M. M. Seibert, J. Hajdu, R. Treusch, and H. N. Chapman, "Ultrafast single-shot diffraction imaging of nanoscale dynamics," Nat. Photonics 2(7), 415-419 (2008).
11. Y. Wang, E. Granados, F. Pedaci, D. Alessi, B. Luther, M. Berrill, and J. J. Rocca, "Phase-coherent, injectionseeded table-top soft-X-ray lasers at 18.9 nm and 13.9 nm," Nat. Photonics 2(2), 94-98 (2008).
12. M. Tanaka, M. Nishikino, T. Kawachi, N. Hasegawa, M. Kado, M. Kishimoto, K Nagashima, and Y. Kato, "Xray laser beam with diffraction-limited divergence generated with two gain media," Opt. Lett. 28(18), 1680-1682 (2003).
13. M. Nishikino, N. Hasegawa, T. Kawachi, H. Yainatani, K. Sukegawa, and K. Nagashima, "Characterization of a high-brilliance soft x-ray laser at 13.9 nm by use of an oscillator-amplifier configuration," Appl. Opt. 47(8), 1129-1134 (2008).
14. J. J. Rocca, C. H. Moreno, M. C. Marconi, and K. Kanizay, "Soft-x-ray laser interferometry of a plasma with a tabletop laser and a Lloyd's mirror," Opt. Lett. 24(6), 420-422 (1999).
15. J. Filevich, J. J. Rocca, M. C. Marconi, S. J. Moon, J. Nilsen, J. H. Scofield, J. Dunn, R. F. Smith, R. Keenan, J. R. Hunter, and V. N. Shlyaptsev, "Observation of a multiply ionized plasma with index of refraction greater than one," Phys. Rev. Lett. 94(3), 035005 (2005).
16. G. Jamelot, D. Ros, B. Rus, M. Kozlova, K. Cassou, S. Kazamias, A. Klisnick, T. Mocek, P. Homer, J. Polan, and M. Stupka, "X-ray laser interference microscopy for advanced studies of laser-induced damages," Proc. Xray Lasers 2006 (ed. Nickles, P. V., and Janulewicz, K. A.), 571-576 (Springer, Netherlands, 2007).
17. Y. Ochi, T. Kawachi, N. Hasegawa, M. Nishikino, T. Ohba, M. Tanaka, M. Kishimoto, T. Kaihori, K. Nagashima, and A. Sugiyama, "Demonstration of submicro Joule, spatially coherent soft-X-ray laser pumped by 0.1 Hertz, 10 Joule, picosecond laser," Jpn. J. Appl. Phys. 48(12), 120212 (2009).
18. J. M. Liu, "Simple technique for measurements of pulsed Gaussian-beam spot sizes," Opt. Lett. 7(5), 196-198 (1982).
19. J. T. Larsen, and S. M. Lane, "HYADES - A plasma hydrodynamic code for dense plasma studies," J. Quant. Spectrosc. Radiat. Transf. 51(1-2), 179-186 (1994).
20. D. von der Linde, and K. Sokolowski-Tinten, "The physical mechanisms of short-pulse laser ablation," Appl. Surf. Sci. 154-155(1-4), 1-10 (2000).
21. K Sokolowski-Tinten, J. Bialkowski, A. Cavalleri, D. von der Linde, A. Oparin, J. Meyer-ter-Vehn, and S. L. Anisimov, "Transient states of matter during short pulse laser ablation," Phys. Rev. Lett. 81(1), 224-227 (1998).
22. Y. Izawa, Y. Setuhara, M. Hashida, M. Fujita, and Y. Izawa, "Ablation and ainorphization of crystalline Si by femtosecond and picosecond laser irradiation," Jpn. J. Appl. Phys. 45(7), 5791-5794 (2006).
23. C. Rose-Petruck, R. Jimenez, T. Guo, A. Cavalleri, C. W. Siders, F. Rksi, J. A. Squier, B. C. Walker, K. R. Wilson, and C. P. J. Barty, "Picosecond-milliangstrom lattice dynamics measured by ultrafast X-ray diffraction," Nature 398(6725), 310-312 (1999).
24. V. V. Temnov, K. Sokolowski-Tinten, P. Zhou, and D. von der Linde, "Ultrafast imaging interferometry at femtosecond laser-excited surfaces," J. Opt. Soc. Am. B 23(9), 1954-1964 (2006).
25. B. Rethfeld, and K Sokolowski-Tinten, "von D. der Linde, and S. I. Anisimov, "Timescales in the response of materials to femtosecond laser excitation," Appl. Phys., A Mater. Sci. Process. 79, 767-769 (2004).
26. P. Stampfli, and K Bennemann, "Time dependence of the laser-induced femtosecond lattice instability of Si and GaAs: Role of longitudinal optical distortions," Phys. Rev. B 49(11), 7299-7305 (1994).