Femtosecond time-resolved interferometric microscopy

Applied Physics A: Materials Science and Processing

Volumn 78, Issue 4, 2004, Pages 483-489

  Temnov, V V ^a,b   Sokolowski Tinten, K ^a   Zhou, P ^a   Von der Linde, D ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b INSTITUTE OF APPLIED PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC SURFACE WAVE DEVICES; ALGORITHMS; APPROXIMATION THEORY; CHARGE COUPLED DEVICES; FOURIER TRANSFORMS; LASER ABLATION; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PHASE TRANSITIONS; REFLECTION; SEMICONDUCTING GALLIUM COMPOUNDS;

SPATIAL RESOLUTION; SURFACE DEFORMATIONS; SURFACE MODIFICATIONS;

INTERFEROMETRY;

EID: 1242307389     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-003-2408-x     Document Type: Article

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