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Volumn 96, Issue 22, 2010, Pages

Electron coherent diffraction tomography of a nanocrystal

Author keywords

[No Author keywords available]

Indexed keywords

3-D IMAGE; 3D DIFFRACTION; 3D STRUCTURE; ALTERNATIVE APPROACH; ANGULAR RANGE; ATOMIC SCALE; BRAGG DIFFRACTION; COHERENT DIFFRACTION; COHERENT ILLUMINATION; DIFFRACTIVE IMAGING; FIELD EMISSION GUNS; ITERATIVE ALGORITHM; NM RESOLUTION; THREE-DIMENSIONAL (3D); X-RAY SOURCES;

EID: 77953587072     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3436639     Document Type: Article
Times cited : (13)

References (21)
  • 4
    • 33644548202 scopus 로고    scopus 로고
    • in, edited by P. Hawkes and J. C. H. Spence (Springer, New York)
    • J. C. H. Spence, in Science of Microscopy, edited by, P. Hawkes, and, J. C. H. Spence, (Springer, New York, 2007).
    • (2007) Science of Microscopy
    • Spence, J.C.H.1
  • 5
    • 0020173780 scopus 로고
    • APOPAI 0003-6935,. 10.1364/AO.21.002758
    • J. R. Fienup, Appl. Opt. APOPAI 0003-6935 21, 2758 (1982). 10.1364/AO.21.002758
    • (1982) Appl. Opt. , vol.21 , pp. 2758
    • Fienup, J.R.1
  • 7
    • 34548012405 scopus 로고    scopus 로고
    • PRBMDO 0163-1829,. 10.1103/PhysRevB.76.064113
    • C. C. Chen, J. Miao, C. W. Wang, and T. K. Lee, Phys. Rev. B PRBMDO 0163-1829 76, 064113 (2007). 10.1103/PhysRevB.76.064113
    • (2007) Phys. Rev. B , vol.76 , pp. 064113
    • Chen, C.C.1    Miao, J.2    Wang, C.W.3    Lee, T.K.4
  • 8
    • 0033595278 scopus 로고    scopus 로고
    • Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens
    • DOI 10.1038/22498
    • J. Miao, P. Charalambous, J. Kirz, and D. Sayre, Nature (London) NATUAS 0028-0836 400, 342 (1999). 10.1038/22498 (Pubitemid 29344194)
    • (1999) Nature , vol.400 , Issue.6742 , pp. 342-344
    • Miao, J.1    Charalambous, P.2    Kirz, J.3    Sayre, D.4
  • 10
    • 0038780636 scopus 로고    scopus 로고
    • Atomic resolution imaging of a carbon nanotube from diffraction intensities
    • DOI 10.1126/science.1083887
    • J. M. Zuo, I. Vartanyants, M. Gao, R. Zhang, and L. A. Nagahara, Science SCIEAS 0036-8075 300, 1419 (2003). 10.1126/science.1083887 (Pubitemid 36638158)
    • (2003) Science , vol.300 , Issue.5624 , pp. 1419-1421
    • Zuo, J.M.1    Vartanyants, I.2    Gao, M.3    Zhang, R.4    Nagahara, L.A.5
  • 13
    • 33745992278 scopus 로고    scopus 로고
    • Three-dimensional mapping of a deformation field inside a nanocrystal
    • DOI 10.1038/nature04867, PII NATURE04867
    • M. A. Pfeifer, G. J. Williams, I. A. Vartanyants, R. Harder, and I. K. Robinson, Nature (London) NATUAS 0028-0836 442, 63 (2006). 10.1038/nature04867 (Pubitemid 44064208)
    • (2006) Nature , vol.442 , Issue.7098 , pp. 63-66
    • Pfeifer, M.A.1    Williams, G.J.2    Vartanyants, I.A.3    Harder, R.4    Robinson, I.K.5
  • 16
    • 0006295088 scopus 로고    scopus 로고
    • JOAOD6 0740-3232,. 10.1364/JOSAA.13.000725
    • R. P. Millane, J. Opt. Soc. Am. A JOAOD6 0740-3232 13, 725 (1996). 10.1364/JOSAA.13.000725
    • (1996) J. Opt. Soc. Am. A , vol.13 , pp. 725
    • Millane, R.P.1
  • 18
    • 77953567138 scopus 로고    scopus 로고
    • As the extinction distance for the (200) reflection of MgO is about 60 nm at 200 kV, we neglect the multiple scattering effects and assume that the intensity is centrosymmetric
    • As the extinction distance for the (200) reflection of MgO is about 60 nm at 200 kV, we neglect the multiple scattering effects and assume that the intensity is centrosymmetric.
  • 19
    • 0028401583 scopus 로고
    • Double conical beam-rocking system for measurement of integrated electron diffraction intensities
    • DOI 10.1016/0304-3991(94)90039-6
    • R. J. Vincent and P. A. Midgley, Ultramicroscopy ULTRD6 0304-3991 53, 271 (1994). 10.1016/0304-3991(94)90039-6 (Pubitemid 24101638)
    • (1994) Ultramicroscopy , vol.53 , Issue.3 , pp. 271-282
    • Vincent, R.1    Midgley, P.A.2
  • 20
    • 33847099938 scopus 로고    scopus 로고
    • Precession electron diffraction: Observed and calculated intensities
    • DOI 10.1016/j.ultramic.2006.04.032, PII S030439910600218X, ELCRYST 2005
    • P. Oleynikov, S. Hovmöller, and X. D. Zou, Ultramicroscopy ULTRD6 0304-3991 107, 523 (2007). 10.1016/j.ultramic.2006.04.032 (Pubitemid 46283612)
    • (2007) Ultramicroscopy , vol.107 , Issue.6-7 , pp. 523-533
    • Oleynikov, P.1    Hovmoller, S.2    Zou, X.D.3
  • 21
    • 0034474988 scopus 로고    scopus 로고
    • Global least-squares determination of Eulerian angles from single electron diffraction patterns of tilted crystals
    • DOI 10.1107/S0021889800005951
    • E. Dimmeler and R. R. Scröder, J. Appl. Crystallogr. JACGAR 0021-8898 33, 1088 (2000). 10.1107/S0021889800005951 (Pubitemid 32182495)
    • (2000) Journal of Applied Crystallography , vol.33 , Issue.4 , pp. 1088-1101
    • Dimmeler, E.1    Schroder, R.R.2


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