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American Journal of Applied Sciences
Volumn 7, Issue 4, 2010, Pages 568-574
Evaluating the maintenance performance of the semiconductor factories based on the analytical hierarchy process and grey relational analysis
Author keywords

Analytical hierarchy process; Grey relational analysis; Maintenance; Performance evaluation; Semiconductor factories
Indexed keywords

EID: 77953508176     PISSN: 15469239     EISSN: 15543641     Source Type: Journal    
DOI: 10.3844/ajassp.2010.568.574     Document Type: Article
Times cited : (9)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.