Study of xenon thermal migration in sintered titanium nitride using nuclear micro-probe

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 11-12, 2010, Pages 1880-1883

  Bes, R ^a   Millard Pinard, N ^a   Gavarini, S ^a   Cardinal, S ^b   Garnier, V ^b   Khodja, H ^c   Malchere A ^b   Martin, P ^d   Peaucelle, C ^a  

^a UNIVERSITÉ LYON 1   (France)

^b CNRS   (France)

^c DIF   (France)

^d IRFM   (France)

Author keywords

Dislocations; Fission product; GFR; Grain boundary; Grain size; Inert matrix; Oxidation; Thermal migration; Titanium nitride; Xenon

Indexed keywords

DISLOCATIONS (CRYSTALS); FISSION PRODUCTS; GRAIN BOUNDARIES; MORPHOLOGY; OXIDATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SINTERING; SURFACE MORPHOLOGY; XENON;

CRYSTALLINE ORIENTATIONS; GRAIN SIZE; IMPLANTED SAMPLES; INERT MATRIX; LATERAL DISTRIBUTIONS; MICRO-PROBES; RUTHERFORD BACK-SCATTERING SPECTROMETRY; THERMAL MIGRATION;

TITANIUM NITRIDE;

EID: 77953322797     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.02.018     Document Type: Article

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