Xenon migration behaviour in titanium nitride

Journal of Nuclear Materials

Volumn 362, Issue 2-3, 2007, Pages 364-373

  Gavarini, S ^a   Toulhoat, N ^a   Peaucelle, C ^a   Martin, P ^b   Mende, J ^a   Pipon, Y ^a   Jaffrezic, H ^a  

^a Lyon Medicine University   (France)

^b DEC   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ANNEALING; BROWNIAN MOVEMENT; CHEMICAL STABILITY; DIFFUSION; FAST REACTORS; FISSION PRODUCTS; GAS COOLED REACTORS; MECHANICAL PROPERTIES; REFRACTORY MATERIALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; XENON;

EVANS MODELS; IN PILE PROCESS; SINTERED SAMPLES; THERMAL MIGRATION;

TITANIUM NITRIDE;

EID: 34247611976     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2007.01.239     Document Type: Article

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