Development of "position-charge-time" tagged spectrometry for ion beam microanalysis

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 210, Issue , 2003, Pages 153-158

  Daudin, Laurent ^a   Khodja, Hicham ^a   Gallien, Jean Paul ^a  

^a CEA SACLAY   (France)

Author keywords

Elemental mapping; RISMIN; Scanning microprobe; Scanning system; Tagged spectrometry

Indexed keywords

DATA ACQUISITION; GAMMA RAYS; ION BEAMS; MAPPING; PARTICLE DETECTORS; SCANNING; SPECTROMETRY;

TAGGED SPECTROMETRY;

NUCLEAR INSTRUMENTATION;

EID: 0043014925     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)01008-5     Document Type: Conference Paper

References (3)

1. Khodja H., Berthoumieux E., Daudin L., Gallien J.P. Nucl. Instr. and Meth. B. 181:2001;83.
2. Plumereau G., Ailloud P., Berger P., Boutard D., Guittet M.J., Ladieu F. Nucl. Instr. and Meth. B. 149(1-2):1999;153.
3. Bettiol Andrew A., van Kan J.A., Sum T.C., Watt F. Nucl. Instr. and Meth. B. 181:2001;49.