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Volumn 7637, Issue , 2010, Pages

High volume manufacturing of nano imprint lithography produced devices: Addressing the stamp supply challenge

Author keywords

high brightness LED; High volume manufacturing; industrial manufacturing; Nano Imprint Lithography; patterned sapphire substrates; Sindre 400; stamp; stamp supply

Indexed keywords

FEATURE SIZES; HIGH BRIGHTNESS LEDS; HIGH VOLUME MANUFACTURING; INDUSTRIAL MANUFACTURING; PATTERN DENSITY; PATTERNED SAPPHIRE SUBSTRATE; STRUCTURE TYPE;

EID: 77953317906     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.848332     Document Type: Conference Paper
Times cited : (3)

References (6)
  • 2
    • 2542485872 scopus 로고    scopus 로고
    • Young's modulus of electroplated Ni thin film for MEMS applications
    • Luo J. K., Flewitt A. J., Spearing S. M., Fleck N. A. and Milne W. I.,"Young's modulus of electroplated Ni thin film for MEMS applications", Mater. Letters, vol. 58, pp. 2306-2309 (2004)
    • (2004) Mater. Letters , vol.58 , pp. 2306-2309
    • Luo, J.K.1    Flewitt, A.J.2    Spearing, S.M.3    Fleck, N.A.4    Milne, W.I.5
  • 3
    • 33646050030 scopus 로고    scopus 로고
    • Nickel stamp fabrication using step & stamp imprint lithography
    • Haatainen T., Majander P., Riekkinen T., Ahopelto J., "Nickel stamp fabrication using step & stamp imprint lithography, Microelectron. Eng., vol. 83, pp. 948-950 (2006)
    • (2006) Microelectron. Eng. , vol.83 , pp. 948-950
    • Haatainen, T.1    Majander, P.2    Riekkinen, T.3    Ahopelto, J.4
  • 4
    • 34247620822 scopus 로고    scopus 로고
    • Fabrication of 50 nm patterned nickel stamp with hot embossing and electroforming process
    • Hong S-H., Lee J-H., Lee H., "Fabrication of 50 nm patterned nickel stamp with hot embossing and electroforming process", Microelectron. Eng., vol. 84, pp. 977-979 (2007)
    • (2007) Microelectron. Eng. , vol.84 , pp. 977-979
    • Hong, S.-H.1    Lee, J.-H.2    Lee, H.3
  • 6
    • 31144450489 scopus 로고    scopus 로고
    • Development and characterization of silane antisticking layers on nickel-based stamps designed for nanoimprint lithography
    • Keil, M., Beck M., Ling T. G. I., Graczyk M., Montelius L. and Heidari B., "Development and characterization of silane antisticking layers on nickel-based stamps designed for nanoimprint lithography. J. Vac. Sci. Techn. 23(2), 575-584 (2005)
    • (2005) J. Vac. Sci. Techn. , vol.23 , Issue.2 , pp. 575-584
    • Keil, M.1    Beck, M.2    Ling, T.G.I.3    Graczyk, M.4    Montelius, L.5    Heidari, B.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.