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Volumn 99, Issue 7, 2010, Pages 3205-3212

A PAT approach to improve process understanding of high shear wet granulation through in-line particle measurement using FBRM C35

Author keywords

Critical process parameter (CPP); Critical quality attribute (CQA); Design of experiments (DOE); FBRM C35; Focused beam reflectance measurement (FBRM); High shear wet granulation; Particle size; Particle size distribution (PSD); Process analytical technology (PAT); Quality by design (QbD)

Indexed keywords

ARTICLE; BATCH PROCESS; DIAGNOSIS, MEASUREMENT AND ANALYSIS; DRUG GRANULATION; EXPERIMENTAL DESIGN; FOCUSED BEAM REFLECTANCE MEASUREMENT; HIGH SHEAR WET GRANULATION; PARTICLE SIZE; PROCESS DEVELOPMENT; PROCESS TECHNOLOGY; QUALITY CONTROL;

EID: 77953298309     PISSN: 00223549     EISSN: 15206017     Source Type: Journal    
DOI: 10.1002/jps.22089     Document Type: Article
Times cited : (65)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.