Physicochemical characterization of thermally aged anodic films on magnetron-sputtered niobium

Journal of the Electrochemical Society

Volumn 157, Issue 7, 2010, Pages

  La Mantia, F ^a,c   Santamaria, M ^a   Di Quarto, F ^a   Habazaki, H ^b  

^a UNIVERSITY OF PALERMO   (Italy)

^b HOKKAIDO UNIVERSITY   (Japan)

^c Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC FILMS; ANODIC NIOBIA; CATHODIC SHIFTS; ELECTROLYTE JUNCTIONS; FLAT BAND; FREQUENCY DEPENDENCE; INTERMEDIATE TEMPERATURES; METAL OXIDE INTERFACE; PHYSICO-CHEMICAL CHARACTERIZATION; SCHOTTKY BARRIERS; SEMICONDUCTOR TRANSITION; SOLID-STATE PROPERTIES;

AMORPHOUS SEMICONDUCTORS; CAPACITANCE; CAPACITORS; ELECTROCHEMICAL CORROSION; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTRONIC DENSITY OF STATES; MAGNETRONS; METALLIC COMPOUNDS; NIOBIUM; NIOBIUM COMPOUNDS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR JUNCTIONS; THERMAL AGING;

ELECTROLYTIC CAPACITORS;

EID: 77953150450     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3428396     Document Type: Article

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