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Volumn 206, Issue 1-4, 2003, Pages 209-217

Angle-resolved X-ray photoelectron spectroscopy study of the oxides on Nb surfaces for superconducting r.f. cavity applications

Author keywords

Angle resolved X ray photoelectron spectroscopy; Nb surface oxide; Nb 2 O 5; Thermal effects

Indexed keywords

ANNEALING; BINDING ENERGY; COMPOSITION; DIFFUSION; ELECTRIC FIELD EFFECTS; ETCHING; SUPERCONDUCTING DEVICES; THERMAL EFFECTS; ULTRAHIGH VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0037441128     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01238-2     Document Type: Article
Times cited : (67)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.