Preparation and structural characterization of SnO2 and GeO2 methanol steam reforming thin film model catalysts by (HR)TEM

Materials Chemistry and Physics

Volumn 122, Issue 2-3, 2010, Pages 623-629

  Lorenz, Harald ^a   Zhao, Qian ^b   Turner, Stuart ^c   Lebedev, Oleg I ^c   Van Tendeloo, Gustaaf ^c   Klötzer, Bernhard ^a   Rameshan, Christoph ^a,d   Penner, Simon ^a  

^a UNIVERSITY OF INNSBRUCK   (Austria)

^b TIANJIN UNIVERSITY   (China)

^c UNIVERSITY OF ANTWERP   (Belgium)

^d FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

Catalysis; Electron energy loss spectroscopy; Electron microscopy; SnO; Thin films

Indexed keywords

ANNEALING TREATMENTS; CATALYTIC PROPERTIES; CROSS CORRELATIONS; DARK FIELD IMAGING; DIFFERENT SUBSTRATES; ENERGY-LOSS SPECTRUM; HIGH OXYGEN PRESSURE; HIGH RESOLUTION; METHANOL STEAM REFORMING; MORPHOLOGY AND COMPOSITION; NANO-MATERIALS; OXYGEN PARTIAL PRESSURE; PERIODIC SYSTEM; POST-OXIDATION; SELECTED AREA ELECTRON DIFFRACTION; SIMILARITIES AND DIFFERENCES; SNO; STRUCTURAL CHARACTERIZATION; SUBSTRATE TEMPERATURE; TEM; THIN FILM MODEL CATALYST;

AMORPHOUS FILMS; CATALYSIS; CATALYSTS; CHEMICAL ANALYSIS; DEPOSITION; DISSOCIATION; ELECTRON DIFFRACTION; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONS; EPITAXIAL FILMS; GALLIUM; GERMANIUM; GERMANIUM OXIDES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; HOLOGRAPHIC INTERFEROMETRY; METHANOL; OXIDE FILMS; OXYGEN; PARTIAL PRESSURE; REACTION KINETICS; SCANNING ELECTRON MICROSCOPY; SODIUM CHLORIDE; STEAM ENGINEERING; THERMAL EVAPORATION; TIN; TITANIUM COMPOUNDS; VAPOR DEPOSITION;

FILM PREPARATION;

EID: 77953139602     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2010.03.057     Document Type: Article

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