External scanning micro-PIXE for the characterization of a polycapillary lens: Measurement of the collected X-ray intensity distribution

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 11-12, 2010, Pages 1945-1948

  Grassi, N ^a   Guazzoni, C ^b   Alberti, R ^b   Klatka, T ^b   Bjeoumikhov, A ^c  

^a INFN SEZIONE DI FIRENZE   (Italy)

^b POLITECNICO DI MILANO   (Italy)

^c Institute for Scientific Instruments GmbH   (Germany)

Author keywords

Scanning micro PIXE; Silicon Drift Detector; X ray polycapillary optics

Indexed keywords

BACK-SCATTERED; CHARACTERISTIC X RAYS; DETECTION SYSTEM; DETECTOR CHIPS; ENERGY RANGES; LIGHT ELEMENTS; MICRO-PIXE; OUT-OF-FOCUS; POLYCAPILLARY LENS; POLYCAPILLARY OPTICS; QUALITY LOSS; SCANNING MICROBEAM; SILICON DRIFT DETECTOR; SPATIAL DISTRIBUTION; TANDETRON ACCELERATORS; TARGET MATERIALS; X RAY INTENSITY; X-RAY ENERGIES;

CHEMICAL ELEMENTS; LENSES; LIGHT TRANSMISSION; OPTICAL INSTRUMENTS; PROTON BEAMS; PROTONS; SCANNING; SIZE DISTRIBUTION; TARGETS; X RAYS;

DETECTORS;

EID: 77953134692     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.02.100     Document Type: Article

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