Capillary optics for real time X-ray diffractometry

Journal of X-Ray Science and Technology

Volumn 13, Issue 4, 2005, Pages 185-190

  Bjeoumikhov, A ^a   Bjeoumikhova, S ^b   Langhoff, N ^a   Wolff, H ^b  

^a IfG Institute for Scientific Instruments GmbH   (Germany)

^b LEIBNIZ INSTITUT FÜR KATALYSE E V AN DER UNIVERSITÄT ROSTOCK   (Germany)

Author keywords

Capillary lens; Capillary optics; Real time imaging; Time resolved diffractometry; X ray camera; X ray diffraction

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; COOLING; DIFFRACTION; MOLYBDENUM; OPTICS; POLYCRYSTALS;

CAPILLAY OPTICS; CCD CAMERAS; DIFFRACTION PATTERNS;

CAPILLARITY;

EID: 29744464069     PISSN: 08953996     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)

1. D. Beschetto, C. Rischell, I. Uschmann, J. Perez, S. Fourmauxet, D. Hulin, E. Förster and A. Rousse, J. Applied of Crystallography 36 (2003), 348-349
2. R. Tommasini, R. Bruch, E. Fill and A. Bjeoumikhov, Applied Physics Letters, to be published.
3. J. Harrison Richard, A.T. Redfern Simon, Buckley Andrew and K.H. Salje Ekhard, Journal of Applied Physics 95(4) (2004), 1706-1717.
4. M.A. Kumakhov, Radiation of channeled particles in crystals, Energoatomizdat, Moscow in Russian, 1986.
5. A. Bjeoumikhov, N. Langhoff, R. Wedell, V. Beloglazov, N. Lebedev and N. Skibina, X-Ray Spectrometry 32 (2003), 172-178.
6. C.A. MacDonald and W.M. Gibson, X-Ray Spectrometry 32 (2003), 258-268.
7. P. Scardi, S. Setti and M. Leoni, Mater. Sci. Forum 321-324 (2000), 162.
8. Y. Hosokawa, S. Ozowa, H. Nakazawa and T. Nakayama, X-ray Spectrometry 26 (1997), 380.
9. M. Haschke, W. Scholz and U. Theis, in: Proceedings of the European Conference on Energy Dispersive X-Ray Spectrometry, J.E. Fermandez and A. Tartari, eds, Editrice Compositors: Bologna, 1999, pp. 157-162.
10. A. Bjeoumikhov, N. Langhoff, J. Rabe and R. Wedell, X-Ray Spectrometry 33 (2004), 312-316.
11. A. Guinier, Théorie et technique de la radiocristallographie, Dinod, Paris, 1956.
12. L. Strüder, N. Meidinger, D. Stotter, J. Kemmer, P. Lechner, P. Leutennegger, H. Soltau, F. Eggert, M. Rohde and T. Schulein, Microscopy and Microanalysis 4 (1999), 622-631.