Use of silicon drift detectors for the detection of medium-light elements in PIXE

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 266, Issue 10, 2008, Pages 2296-2300

  Alberti, R ^a   Bjeoumikhov, A ^b   Grassi, N ^c   Guazzoni, C ^a   Klatka, T ^a   Longoni, A ^a,d   Quattrone, A ^a  

^a POLITECNICO DI MILANO   (Italy)

^b Institute for Scientific Instruments GmbH   (Germany)

^c UNIVERSITY OF FLORENCE   (Italy)

^d IFN CNR   (Italy)

Author keywords

07.85.Fv; 07.85.Nc; 41.50+h; 78.70.En; 82.80.Ej; High resolution X ray spectroscopy; PIXE; Silicon drift detector; X ray polycapillary

Indexed keywords

BACKSCATTERING; DETECTORS; THERMOELECTRIC EQUIPMENT; X RAY ANALYSIS;

HIGH-RESOLUTION X-RAY SPECTROSCOPY; SILICON DRIFT DETECTOR; X-RAY POLYCAPILLARY;

SILICON;

EID: 44449094444     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.03.007     Document Type: Article

References (11)

1. Gatti E., and Rehak P. Nucl. Instr. and Meth. A 225 (1984) 608
2. Lechner P., Pahlke A., and Soltau H. X-ray Spectrom. 33 (2004) 256
3. Lechner P., et al. Nucl. Instr. and Meth. A 377 (1996) 346
4. Lechner P., et al. Nucl. Instr. and Meth. A 458 (2001) 281
5. Longoni A., Fiorini C., Guazzoni C., Buzzetti S., Bellini M., Strüder L., Lechner P., Bjeoumikov A., and Kemmer J. IEEE Trans. Nucl. Sci. 53 2 (2006) 641
6. Newbury D.E. Microsc. Microanal. 12 (2006) 26
7. Hartmann R., Stephan K.-H., and Strüder L. Nucl. Instr. and Meth. A 439 (2000) 216
8. Bjeoumikhov A., Langhoff N., Wedell R., Beloglazov V., Lebed'ev N., and Skibina N. X-Ray Spectrom. 32 (2003) 172
9. Kumakhov M.A., and Komarov F.F. Phys. Rep. 191 (1990) 289
10. Kanngießer B., Karydas A.G., Schütz R., Sokaras D., Reiche I., Röhrs S., Pichon L., and Salomon J. Nucl. Instr. and Meth. B 264 (2007) 383
11. Alberti R., Fiorini C., Longoni A., and Soltau H. Nucl. Instr. and Meth. A 568 (2006) 106