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Volumn 171, Issue 1-3, 2010, Pages 155-158

ZnO sensing film thickness effects on the sensitivity of surface plasmon resonance sensors with angular interrogation

Author keywords

Sensing films; Surface plasmon resonance; ZnO

Indexed keywords

ATOMIC FORCE MICROSCOPY; FILM THICKNESS; GLASS SUBSTRATES; II-VI SEMICONDUCTORS; MAGNETRONS; METALLIC FILMS; REFRACTIVE INDEX; SENSITIVITY ANALYSIS; SILVER; SILVER COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE PLASMON RESONANCE;

EID: 77953133803     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2010.03.090     Document Type: Article
Times cited : (18)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.