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Volumn 171, Issue 1-3, 2010, Pages 155-158
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ZnO sensing film thickness effects on the sensitivity of surface plasmon resonance sensors with angular interrogation
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Author keywords
Sensing films; Surface plasmon resonance; ZnO
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FILM THICKNESS;
GLASS SUBSTRATES;
II-VI SEMICONDUCTORS;
MAGNETRONS;
METALLIC FILMS;
REFRACTIVE INDEX;
SENSITIVITY ANALYSIS;
SILVER;
SILVER COMPOUNDS;
SPECTROSCOPIC ELLIPSOMETRY;
SURFACE PLASMON RESONANCE;
ATOMIC FORCE;
FILM-THICKNESS;
GLASS SUBSTRATES;
RADIO-FREQUENCY-MAGNETRON SPUTTERING;
RESONANCE CURVES;
SENSING FILMS;
SURFACE PLASMON RESONANCE SENSOR;
SURFACE-PLASMON RESONANCE;
THICKNESS EFFECT;
ZNO FILMS;
ZINC OXIDE;
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EID: 77953133803
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mseb.2010.03.090 Document Type: Article |
Times cited : (18)
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References (26)
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