X-ray photoelectron spectroscopy investigation of oxidation states in molybdenum thin films for Cu (InGa) Se2 applications

Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics

Volumn 28, Issue 3, 2010, Pages 545-548

  Kang, Y C ^a   Khanal, R ^b   Park, J Y ^a   Ramsier, R D ^b   Khatri, H ^c   Marsillac, S ^c  

^a Pukyong National University   (South Korea)

^b UNIVERSITY OF AKRON   (United States)

^c UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; DEPOSITION; MOLYBDENUM; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; SODIUM; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

AR GAS PRESSURE; OXIDATION STATE; SODA LIME GLASS;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 77952982076     PISSN: 21662746     EISSN: 21662754     Source Type: Journal    
DOI: 10.1116/1.3425634     Document Type: Conference Paper

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