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Volumn 85, Issue 12, 1999, Pages 8415-8418

X-ray photoelectron spectroscopy study of low-temperature molybdenum oxidation process

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0010029649     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370690     Document Type: Article
Times cited : (37)

References (24)
  • 19
    • 0004099866 scopus 로고    scopus 로고
    • National Institute of Standard and Technology, Gaithersburg, MD
    • NIST x-ray photoelectron spectoscopy database, National Institute of Standard and Technology, Gaithersburg, MD (1997).
    • (1997) NIST X-ray Photoelectron Spectoscopy Database
  • 20
    • 85034142390 scopus 로고    scopus 로고
    • note
    • XPS sensitivity factors Data Sheet supplied by Leybold-Heraeus with a LH 10 ESCA spectrometer, 1985, corrected for transmission function of VGS ESCALAB instrument.
  • 22
    • 0013501792 scopus 로고
    • Theory of metal oxidation
    • North-Holland, Amsterdam
    • A. T. Fromhold, Jr., Theory of Metal Oxidation, Series Defects un Cristalline Solids, Vol. 9 (North-Holland, Amsterdam, 1976), p. 106.
    • (1976) Series Defects un Cristalline Solids , vol.9 , pp. 106
    • Fromhold A.T., Jr.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.