Nanoscale electrodes by conducting atomic force microscopy: Oxygen reduction kinetics at the Pt|CsHSO4 interface

ACS Nano

Volumn 4, Issue 5, 2010, Pages 2811-2821

  Louie, Mary W ^a   Hightower, Adrian ^c   Haile, Sossina M ^a,b  

^a Department of Chemical Engineering ^*  (United States)

^b California Institute of Technology   (United States)

^c OCCIDENTAL COLLEGE   (United States)

Author keywords

Cyclic voltammetry; Electrode kinetics; Fuel cells; Impedance spectroscopy; Microelectrode; Scanning probe microscopy; Solid acid

Indexed keywords

AC IMPEDANCE SPECTROSCOPY; ACTIVATED PROCESS; ACTIVATION BARRIERS; BUTLER-VOLMER; CAPACITIVE BEHAVIOR; CHARGE-TRANSFER REACTIONS; COMPREHENSIVE STUDIES; CONDUCTING AFM; CONDUCTING ATOMIC FORCE MICROSCOPY; ELECTROCHEMICAL REACTIONS; ELECTRODE GEOMETRIES; ELECTRODE KINETICS; ELECTROLYTE SURFACES; EXCHANGE COEFFICIENTS; EXCHANGE CURRENTS; EXPONENTIAL DEPENDENCE; IMPEDANCE MEASUREMENT; IMPEDANCE SPECTROSCOPY; INDEPENDENT SET; INTERFACIAL PROCESS; MACRO SCALE; MULTIPLE PROCESS; NANO SCALE; OPEN CIRCUIT CONDITIONS; ORDERS OF MAGNITUDE; OVERPOTENTIAL; OXYGEN REDUCTION; OXYGEN REDUCTION KINETICS; SOLID ACID; SPATIAL AVERAGING;

ACIDS; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CHARGE TRANSFER; CURRENT VOLTAGE CHARACTERISTICS; ELECTROCHEMICAL ELECTRODES; ELECTROLYTES; ELECTROLYTIC REDUCTION; FUEL CELLS; ION EXCHANGE; MICROELECTRODES; NANOSTRUCTURED MATERIALS; OXYGEN; PHASE INTERFACES; PLATINUM; PROBES;

CYCLIC VOLTAMMETRY;

EID: 77952924606     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn100084h     Document Type: Article

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