Surface morphology and proton conduction imaging of nafion membrane

Chemistry Letters

Volumn 37, Issue 2, 2008, Pages 164-165

  Takimoto, Naohiko ^a   Ohira, Akihiro ^a   Takeoka, Yuko ^b   Rikukawa, Masahiro ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b SOPHIA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 40449128524     PISSN: 03667022     EISSN: None     Source Type: Journal    
DOI: 10.1246/cl.2008.164     Document Type: Article

References (8)

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2. T. D. Gierke, W. Y. Hsu, in Perfluorinated Ionomer Membranes, ACS Symposium Series 180, ed. by A. Eisenberg, H. L. Yeager, American Chemical Society, Washington, DC, 1982, p. 283.
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6. X. Xie, O. Kwon, D.-M. Zhu, T. V. Nguyen, G. Lin, J. Phys. Chem. B 2007, 111, 6134.
7. In order to avoid the other possibilities of interpretation for the obtained images, many control experiments were conducted. As a result, no current is detected without Pt-coated cantilever, humidified condition, bias voltage, and electrical connection between sample stage and membrane. This indicates that the detected current is attributed to electrochemical reactions, thus they reflect the proton conduction of the membrane. The influence of the applied bias voltage upon both the topographic and the phase images is also checked and found to be negligible.
8. A. Lehmani, S. Durand-Vidal, P. Turq, J. Appl. Polym. Sci. 1998, 68, 503.