Conduction behavior change in amorphous LaLuO3 dielectrics based on correlated barrier hopping theory

Applied Physics Letters

Volumn 96, Issue 18, 2010, Pages

  Li, Kui ^a   Xia, Yidong ^a   Xu, Bo ^a   Gao, Xu ^a   Guo, Hongxuan ^b   Liu, Zhiguo ^a   Yin, Jiang ^a  

^a NANJING UNIVERSITY   (China)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BEHAVIOR CHANGE; CORRELATED BARRIER HOPPING; HIGH-RESISTANCE STATE; LOW-RESISTANCE STATE; MEMORY APPLICATIONS; RESISTANCE STATE; UNIPOLAR SWITCHING;

OXYGEN; SOLVENTS;

OXYGEN VACANCIES;

EID: 77952809255     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3425671     Document Type: Article

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