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Volumn , Issue , 2010, Pages 727-730
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Thin-film piezoelectric-on-substrate resonators with Q enhancement and TCF reduction
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Author keywords
[No Author keywords available]
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Indexed keywords
ALN;
IN-VACUUM;
LATERAL MODES;
METAL ELECTRODES;
PIEZOELECTRIC LAYERS;
Q ENHANCEMENT;
QUALITY FACTORS;
SI SUBSTRATES;
TEMPERATURE COEFFICIENT OF FREQUENCIES;
THIN FILM PIEZOELECTRIC;
VOLUME RATIO;
BANDPASS FILTERS;
MECHANICAL ENGINEERING;
MECHANICS;
PIEZOELECTRICITY;
Q FACTOR MEASUREMENT;
REACTIVE ION ETCHING;
RESONATORS;
SILICON;
SUBSTRATES;
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EID: 77952757612
PISSN: 10846999
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/MEMSYS.2010.5442303 Document Type: Conference Paper |
Times cited : (59)
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References (4)
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