Piezoelectric properties of {100}-oriented epitaxial BiCoO 3-BiFeO3 films measured using synchrotron X-ray diffraction

Japanese Journal of Applied Physics

Volumn 48, Issue 9 Part 2, 2009, Pages

  Yasui, Shintaro ^a   Sakata, Osami ^b,c   Nakajima, Mitsumasa ^a   Utsugi, Satoru ^a   Yazawa, Keisuke ^a   Yamada, Tomoaki ^a   Funakubo, Hiroshi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POLARIZATION; ELECTROSTRICTIVE COEFFICIENTS; PIEZOELECTRIC COEFFICIENT; PIEZOELECTRIC PROPERTY; SRTIO; SYNCHROTRON X RAY DIFFRACTION;

OPTICAL SWITCHES; POLARIZATION; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY DIFFRACTION;

PIEZOELECTRICITY;

EID: 77952677298     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.48.09KD06     Document Type: Article

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