Automatic twin statistics from electron backscattered diffraction data

Journal of Microscopy

Volumn 238, Issue 3, 2010, Pages 218-229

  Marshall, P E ^a   Proust, G ^b,c   Rogers, J T ^d   McCabe, R J ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF SYDNEY   (Australia)

^c UNIVERSITY OF SYDNEY   (Australia)

^d University of California   (United States)

Author keywords

EBSD; Magnesium; Twinning; Uranium; Zirconium

Indexed keywords

CODES (SYMBOLS); CRYSTAL SYMMETRY; ELECTRON DIFFRACTION; TWINNING; URANIUM; ZIRCONIUM;

AREA FRACTION; COMPUTER CODES; DIFFRACTION DATA; EBSD; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACK-SCATTERED DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; GRAINSIZE; STRESS STATE; TYPE II;

MAGNESIUM;

MAGNESIUM; URANIUM; ZIRCONIUM;

ACCURACY; ARTICLE; CHEMICAL STRESS; COMPUTER PROGRAM; CONTROLLED STUDY; CRYSTAL STRUCTURE; ELECTRON BACKSCATTERED DIFFRACTION; MOLECULAR SIZE; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SCANNING ELECTRON MICROSCOPY; STATISTICAL ANALYSIS; THICKNESS;

EID: 77952618084     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2009.03343.x     Document Type: Article

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