Advanced characterization of twins using automated electron backscatter diffraction

Materials Science Forum

Volumn 408-412, Issue I, 2002, Pages 511-516

  Wright, Stuart I ^a   Bingert, John ^b   Mason, Thomas A ^c   Larsen, Ryan J ^d  

^a TSL   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

^d Department of Electrical and Computer Engineering   (United States)

Author keywords

Deformation Twinning; Electron Backscatter Diffraction EBSD; Orientation Imaging Microscopy OIM

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; PLASTIC DEFORMATION; SCANNING ELECTRON MICROSCOPY; TWINNING; ZIRCONIUM;

ORIENTATION IMAGING MICROSCOPY (OIM);

POLYCRYSTALS;

EID: 0036947030     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.408-412.511     Document Type: Conference Paper

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