A semiautomated electron backscatter diffraction technique for extracting reliable twin statistics

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 35 A, Issue 12, 2004, Pages 3745-3751

  Henrie, B L ^a   Mason, T A ^a   Hansen, B L ^b  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; CRYSTALLOGRAPHY; DEFORMATION; ELECTRON DIFFRACTION; GRAIN SIZE AND SHAPE; MATHEMATICAL MODELS; METALLOGRAPHIC MICROSTRUCTURE; STATISTICAL METHODS;

CRYSTALLOGRAPHIC TWIN IDENTIFICATION; DEFORMATION TWINNING; ELECTRON BACKSCATTER DIFFRACTION;

ZIRCONIUM;

EID: 12144253371     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-004-0280-8     Document Type: Article

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