Advances in deformation twin characterization using electron backscattered diffraction data

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 33, Issue 13, 2002, Pages 949-954

  Mason, T A ^a   Bingert, J F ^a   Kaschner, G C ^a   Wright, S I ^b   Larsen, R J ^c  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b EDAX TSL   (United States)

^c Department of Electrical and Computer Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AREA FRACTION; BOUNDARY POSITIONS; CORRELATED ELECTRONS; CROSS SECTION; DEFORMATION TWIN; DEFORMATION TWINNING; ELECTRON BACK-SCATTERED DIFFRACTION; GRAPHIC THEORY; KEY FEATURE; MACROSCOPIC STRESS; MIS-ORIENTATION; RECENT PROGRESS; SCHMID FACTORS; TWIN BOUNDARIES;

DEFORMATION; TWINNING;

ELECTRON DIFFRACTION;

EID: 0036494179     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-002-1027-z     Document Type: Article

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