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Volumn 7, Issue 3-4, 2010, Pages 786-789

A-SiC:H films deposited by PECVD for MEMS applications

Author keywords

[No Author keywords available]

Indexed keywords

A-SIC:H; AS-DEPOSITED FILMS; DEPOSITION CONDITIONS; MEMS APPLICATIONS; PLASMA CONDITIONS; POST DEPOSITION ANNEALING; POWER DENSITIES; STRESS FREE; YOUNG'S MODULUS;

EID: 77952557995     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200982888     Document Type: Conference Paper
Times cited : (11)

References (16)
  • 14
    • 77952567273 scopus 로고    scopus 로고
    • Florianópolis, Brazil, 2005. Microelectronics Technology and Devices SBMicro 2005, Pennington, New Jersey, USA The Electrochemical Society, Inc.
    • M.N.P. Carreño and G. Rehder, in: SBMicro 2005, Florianópolis, Brazil, 2005. Microelectronics Technology and Devices SBMicro 2005, Pennington, New Jersey, USA (The Electrochemical Society, Inc., 2005), Vol.08, pp. 372-379.
    • (2005) SBMicro 2005 , vol.8 , pp. 372-379
    • Carreño, M.N.P.1    Rehder, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.