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Volumn 26, Issue 6, 2010, Pages 4339-4345

Molecular arrangement of alkylated fullerenes in the liquid crystalline phase studied with X-ray diffraction

Author keywords

[No Author keywords available]

Indexed keywords

ALIPHATIC CHAINS; BI-LAYER; BRAGG PEAKS; CARBON CHAINS; ELECTRONIC DENSITY; FLUID BILAYER; INTERDIGITATIONS; LIQUID CRYSTALLINE PHASE; LONG AXIS; MOLECULAR ARRANGEMENTS; MOLECULAR ORGANIZATION; MOLECULAR PACKINGS; RELATIVE INTENSITY; UNIT CELLS; X-RAY PATTERNS;

EID: 77952413031     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la903429j     Document Type: Article
Times cited : (17)

References (42)
  • 32
    • 77957916332 scopus 로고    scopus 로고
    • The Fresnel reflectivity represented by eq 3 is strictly speaking only valid for the polarization component perpendicular to the plane of incidence, the plane that contains both incident and reflected waves; however, for typical X-ray index of refraction values and at the low incidence angles of the experiments, both components are similar and eq 3 constitutes therefore a good approximation
    • The Fresnel reflectivity represented by eq 3 is strictly speaking only valid for the polarization component perpendicular to the plane of incidence, the plane that contains both incident and reflected waves; however, for typical X-ray index of refraction values and at the low incidence angles of the experiments, both components are similar and eq 3 constitutes therefore a good approximation.
  • 33
    • 77957917478 scopus 로고    scopus 로고
    • The X-ray beam finite size is taken into account by convoluting the theoretical reflectivity with a Gaussian function with full width at half-maximum corresponding to the resolution of the beam. Background radiation is considered in the form of a constant added to the reflectivity profile
    • The X-ray beam finite size is taken into account by convoluting the theoretical reflectivity with a Gaussian function with full width at half-maximum corresponding to the resolution of the beam. Background radiation is considered in the form of a constant added to the reflectivity profile.
  • 34
    • 77957930669 scopus 로고    scopus 로고
    • Typically, in nonconducting materials, ßabs is orders of magnitude lower than d, meaning that it can be ignored in a first approximation. Therefore, the absorption of the films is taken to be zero, or equivalently the index of refraction is always treated as a real number in the models
    • Typically, in nonconducting materials, ßabs is orders of magnitude lower than d, meaning that it can be ignored in a first approximation. Therefore, the absorption of the films is taken to be zero, or equivalently the index of refraction is always treated as a real number in the models.
  • 35
    • 77957904610 scopus 로고    scopus 로고
    • Because the glass slide substrate mainly influences the reflectivity part of the spectra, it is neglected in the models
    • Because the glass slide substrate mainly influences the reflectivity part of the spectra, it is neglected in the models.
  • 36
    • 77957917937 scopus 로고    scopus 로고
    • Because the number of reflecting layers mainly influences the broadness of the Bragg peaks, which are actually resolution limited, an arbitrary number of 90 reflecting layers is used in the models for all samples
    • Because the number of reflecting layers mainly influences the broadness of the Bragg peaks, which are actually resolution limited, an arbitrary number of 90 reflecting layers is used in the models for all samples.
  • 37
    • 77957899737 scopus 로고    scopus 로고
    • It is possible to model the roughness or fluctuations of the film by introducing a decay factor in eq 3. However, because this is not the main objective of this work and for simplification, no film roughness or fluctuations are considered in the box models proposed. The presence of several peaks in the experimental X-ray diffraction spectra suggests indeed that the roughness should be small and small enough fluctuations should not change the main results
    • It is possible to model the roughness or fluctuations of the film by introducing a decay factor in eq 3. However, because this is not the main objective of this work and for simplification, no film roughness or fluctuations are considered in the box models proposed. The presence of several peaks in the experimental X-ray diffraction spectra suggests indeed that the roughness should be small and small enough fluctuations should not change the main results.
  • 40
    • 77957901846 scopus 로고    scopus 로고
    • the case of Figure 3, where the prefactor of eq 44 is equal to 2, it is easy to see that absent peaks are expected at even and odd order Bragg peaks for oppositeand same-sign slopes, respectively
    • In the case of Figure 3, where the prefactor of eq 44 is equal to 2, it is easy to see that absent peaks are expected at even and odd order Bragg peaks for oppositeand same-sign slopes, respectively.
  • 41
    • 77957910149 scopus 로고    scopus 로고
    • the previous study,26 the d-spacings were calculated only from the (001) peak positions and found to be 55.9A° for (3,4,5)C20C60, 45.4A° for (3,4,5)C16C60, and 46.4 A° for 34)C20C60
    • In the previous study,26 the d-spacings were calculated only from the (001) peak positions and found to be 55.9A° for (3,4,5)C20C60, 45.4A° for (3,4,5)C16C60, and 46.4 A° for (3,4)C20C60.
  • 42
    • 77957899516 scopus 로고    scopus 로고
    • SES Research, accessed 07/07/
    • SES Research, http://sesres.com/PhysicalProperties.asp (accessed 07/07/2009).
    • (2009)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.