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Volumn 25, Issue 6, 2010, Pages 1416-1425

Real-time compact thermal models for health management of power electronics

Author keywords

Electrothermal models; Flotherm model; Halfbridge insulated gate bipolar transistor (IGBT); Junction temperatures; Real time

Indexed keywords

ELECTRO-THERMAL MODEL; ELECTROTHERMAL MODELS; HALF-BRIDGE; HALFBRIDGE INSULATED GATE BIPOLAR TRANSISTOR (IGBT); JUNCTION TEMPERATURES; REAL TIME;

EID: 77952249613     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPEL.2010.2040634     Document Type: Article
Times cited : (184)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.