Thermal monitoring and testing of electronic systems

IEEE Transactions on Components and Packaging Technologies

Volumn 22, Issue 2, 1999, Pages 231-237

  Székely, Vladimir ^a   Rencz, Mârta ^a   Pâhi, Andrâs ^a   Courtois, Bernard ^a  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; SENSORS;

OVERHEATING PROTECTION; THERMAL MONITORING; THERMAL SENSORS; THERMAL TESTING;

ELECTRONICS PACKAGING;

EID: 0033316024     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/6144.774737     Document Type: Article

References (10)

1. V. Székely, Cs. Märta, M. Rencz, Zs. Benedek, and B. Courtois, "Design for thermal testability (DfTT) and a CMOS realization," Sens. Actuators A. vol. 55, pp. 29-33, 1996.
2. V. Székely, M. Rencz, J. M. Karam, M. Lubaszewski, and B. Courtois, "Thermal monitoring of self-checking systems," J. Electro. Test.: Theory Appl. (JETTA). vol. 12. pp. 81-92, 1998.
3. IEEE Standard Board, IEEE Standard 1149.1-1990, Standard test Access Port and Boundary Scan Architecture, 1990.
4. E. Montane, S. A. Bota, and J. Samitier, "A compact temperature sensor of a 1.0 /j,m CMOS technology using lateral PNP transistors," in Proc. THERMINIC'96 Workshop. Sept. 1996, pp. 25-27.
5. A. Bakker and J.H. Huijsing: "Micropower CMOS smart temperature sensor," in Proc. ESSCIRC'95. Lille, France, Sept. 1995, pp. 238-241.
6. K. Arabi and B. Kaminska, "Built-in temperature and current sensors for online oscillation testing," in Proc. 2nd IEEE Int. Online Testing Workshop. Biarritz, France, July 8-10, 1996, pp. 13-16.
7. V. Székely, Cs. Malta, Zs. Kohäri, and M. Rencz, "CMOS sensors for online thermal monitoring of VLSI circuits," IEEE Trans. VLSI Syst., vol. 5, no. 3, pp. 270-276, 1997.
8. V. Székely, M. Rencz, S. Török, Cs. Mârta, L. Liptäk-Fegö, "CMOS sensors and built-in test circuitry for thermal testing of IC's," Sens. Actuators A, vol. 71, nos. 1-2, pp. 10-19, 1998.
9. V. Székely, M. Rencz, and B. Courtois, Thermal transient testing," Microelectron. Int., no. 43, pp. 1-5, May 1997.
10. V. Székely, "Identification of RC networks by deconvolution: Chances and limits," IEEE Trans. Circuits Syst. L, vol. 45, pp. 244-258, Mar. 1998.