Electro-optic sampling at 90 degree interaction geometry for time-of-arrival stamping of ultrafast relativistic electron diffraction

Physical Review Special Topics - Accelerators and Beams

Volumn 13, Issue 2, 2010, Pages

  Scoby, C M ^a   Musumeci, P ^a   Moody, J T ^a   Gutierrez, M S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77952171841     PISSN: None     EISSN: 10984402     Source Type: Journal    
DOI: 10.1103/PhysRevSTAB.13.022801     Document Type: Article

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