Simulation study for electro-optic sampling measurement of low-energy electron beam

Japanese Journal of Applied Physics

Volumn 47, Issue 1, 2008, Pages 342-346

  Parc, Yong Woon ^a   Hong, Juno ^a   Ko, In Soo ^a   Kim, Changbum ^a   Huang, Jung Yun ^a   Lee, Soo Heyong ^b  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Korea Research Institute of Standards and Science   (South Korea)

Author keywords

Electro optic sampling; Electron beam; XFEL

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC PULSE; ELECTROOPTICAL EFFECTS; FOURIER TRANSFORMS; FREE ELECTRON LASERS; PULSE POSITION MODULATION;

ELECTRO-OPTIC SAMPLING; ELECTRON BUNCH LENGTH; TEMPORAL PROPERTIES; XFEL;

ELECTRON BEAMS;

EID: 38549146898     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.342     Document Type: Article

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