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Volumn 82, Issue 9, 2010, Pages 3519-3522

X-ray diffraction imaging of anatase and rutile

Author keywords

[No Author keywords available]

Indexed keywords

EFFICIENT METHOD; QUANTITATIVE ANALYSIS; STABLE PHASIS; TIO; X-RAY DIFFRACTION IMAGING; XRD;

EID: 77951819896     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac9024126     Document Type: Article
Times cited : (82)

References (21)
  • 9
    • 77951868500 scopus 로고    scopus 로고
    • In Nat. Mater., 2009, 8 (4), the Insight section features a compilation of articles on recent electron and X-ray microscopy
    • In Nat. Mater., 2009, 8 (4), the Insight section features a compilation of articles on recent electron and X-ray microscopy.
  • 21
    • 77951823895 scopus 로고    scopus 로고
    • Japanese Patent 3834652
    • Sakurai, K. and Mizusawa, M. Japanese Patent 3834652, 2006.
    • (2006)
    • Sakurai, K.1    Mizusawa, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.