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Volumn 6, Issue 12, 2009, Pages 2785-2788

Surface morphology of indium phosphide grown on silicon by nano-epitaxial lateral overgrowth

Author keywords

[No Author keywords available]

Indexed keywords

AFM; EPITAXIAL LATERAL OVERGROWTH; GROWTH CONDITIONS; INP; MICRO PHOTOLUMINESCENCE; OPTICAL QUALITIES; PLANAR LAYERS; PROFILOMETERS;

EID: 77951683616     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200982546     Document Type: Conference Paper
Times cited : (9)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.