Thickness and frequency dependence of electric-field-induced strains of sol-gel derived (Pb0.97La0.02)(Zr0.95Ti 0.05)O3 antiferroelectric films

Journal of Sol-Gel Science and Technology

Volumn 53, Issue 2, 2010, Pages 366-371

  Hao, Xihong ^a,b   Zhai, Jiwei ^a   Zhou, Fen ^b   Song, Xiwen ^b   An, Shengli ^b  

^a TONGJI UNIVERSITY   (China)

^b INNER MONGOLIA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Antiferroelectric films; Phase switching; Sol gel process; Strains

Indexed keywords

ANTIFERROELECTRIC FILMS; CRACK SURFACES; ELECTRIC-FIELD-INDUCED STRAIN; FIELD-INDUCED STRAIN; FREQUENCY DEPENDENCE; FREQUENCY-DEPENDENT; MAXIMUM VALUES; MEASUREMENT FREQUENCY; PHASE SWITCHING; PREFERRED ORIENTATIONS; SEM; SILICON SUBSTRATES; SOL-GEL METHODS;

ANTIFERROELECTRICITY; GELS; LEAD; NANOSTRUCTURED MATERIALS; PLATINUM; SOL-GELS; SOLS; ZIRCONIUM;

SOL-GEL PROCESS;

EID: 77951667798     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10971-009-2104-1     Document Type: Article

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