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Journal of Materials Science

Volumn 45, Issue 12, 2010, Pages 3190-3197

AFM indentation method used for elastic modulus characterization of interfaces and thin layers

(3) Monclus, M A a Young, T J b Di Maio, D a

a NATIONAL PHYSICAL LABORATORY (United Kingdom)

b UNIVERSITY OF SURREY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM TIP; ANALYSIS ALGORITHMS; CANTILEVER DEFLECTION; COMPOSITE CASE; CONTACT POINTS; CUSTOMIZED SOFTWARE; ELASTIC MODULUS VALUES; FORCE CURVE; FORCE-VOLUME; GLASS FLAKES; HIGH RESOLUTION; HIGH-LATERAL RESOLUTION; INDENTATION ARRAYS; INDENTATION CURVE; INDENTATION METHOD; INSTRUMENTED INDENTATION; INTERMETALLIC LAYER; INTERPHASE REGIONS; LEAD-FREE; LOCAL ELASTIC PROPERTIES; MEASUREMENT METHODS; NONCONTACT REGIONS; REFERENCE MATERIAL; SOLDER JOINTS; SOLDER MATERIAL; THIN LAYERS; TIP RADIUS; YOUNG'S MODULUS;

ELASTIC MODULI; ELASTICITY; GLASS; INTERMETALLICS; LEAD; NANOINDENTATION; REINFORCED PLASTICS; SOLDERING ALLOYS;

ATOMIC FORCE MICROSCOPY;

EID: 77951666369 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-010-4326-6 Document Type: Article

Times cited : (57)

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