Determination of the bulk lifetime of bare multicrystalline silicon wafers

Progress in Photovoltaics: Research and Applications

Volumn 18, Issue 3, 2010, Pages 204-208

  Bothe, K ^a   Krain, R ^a   Falster, R ^b   Sinton, R ^c  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

^b MEMC Electronic Materials   (Italy)

^c Sinton Consulting Inc   (United States)

Author keywords

Carrier lifetime; Multicrystalline; QSSPC; Silicon; Solar cell wafer

Indexed keywords

BULK CARRIER; BULK LIFETIME; EFFECTIVE LIFETIME; ELECTRONIC QUALITY; EXPERIMENTAL STUDIES; IN-LINE; IN-LINE INSPECTIONS; MULTICRYSTALLINE; MULTICRYSTALLINE SILICON WAFERS; NUMERICAL MODELLING; QSSPC; SAW DAMAGES; SURFACE CONDITIONS; SURFACE PASSIVATION;

CARRIER LIFETIME; INSPECTION; PASSIVATION; POLYSILICON; SEMICONDUCTING SILICON COMPOUNDS; SOLAR CELLS;

SILICON WAFERS;

EID: 77951647295     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.975     Document Type: Article

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